XRF (X-Ray Fluorescence) testing is a fast, non-destructive method used to detect lead in paint. It uses a handheld XRF analyzer to measure lead levels beneath multiple layers of paint without the need for scraping or damage. This EPA-approved testing method provides accurate, on-the-spot results, making it an essential tool for lead-based paint inspections and compliance with NYC Local Law 31.

Paint chip sampling is a method used to test for lead in paint by collecting small samples from a surface. The samples are carefully removed, sealed, and sent to an accredited laboratory for analysis. This method provides highly accurate results and is often used for regulatory compliance and detailed lead assessments.

Dust wipe sampling is a method used to detect lead contamination in settled dust. A specialized wipe is used to collect dust from surfaces such as floors, windowsills, and other high-contact areas. The samples are then sent to an accredited laboratory for analysis. This method is commonly used for risk assessment and is required for clearance testing after lead remediation work to ensure that lead dust levels meet safety standards before re-occupancy.